Title :
Waveforms-Only Based Nonlinear De-Embedding in Active Devices
Author :
Avolio, Gustavo ; Schreurs, Dominique M M -P ; Raffo, Antonio ; Crupi, Giovanni ; Vannini, Giorgio ; Nauwelaers, Bart
Author_Institution :
Electron. Eng. Dept., KU Leuven, Leuven, Belgium
fDate :
4/1/2012 12:00:00 AM
Abstract :
A novel nonlinear de-embedding procedure based on only the use of low- and high-frequency vector large-signal measurements is proposed. The nonlinear Q-V characteristics, along with the parasitic network, are here determined by combining vector measurements with numerical optimization. Consequently, the knowledge of their contributions allows one to retrieve the actual waveform at the current generator plane starting from any high-frequency load line.
Keywords :
field effect transistors; power amplifiers; waveform generators; FET; active devices; current generator plane; high-frequency load line; high-frequency vector large-signal measurement; low-frequency vector large-signal measurement; nonlinear Q-V characteristics; numerical optimization; parasitic network; power amplifier; waveform-only-based nonlinear deembedding; Current measurement; FETs; Generators; Load modeling; Mathematical model; Optimization; Voltage measurement; ${rm I}$- ${rm V}$; ${rm Q}$-${rm V}$; LSNA; nonlinear de-embedding; optimization; vector large-signal measurements;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/LMWC.2012.2189375
