Waveforms-Only Based Nonlinear De-Embedding in Active Devices

Author

Avolio, Gustavo ; Schreurs, Dominique M M -P ; Raffo, Antonio ; Crupi, Giovanni ; Vannini, Giorgio ; Nauwelaers, Bart

Author_Institution

Electron. Eng. Dept., KU Leuven, Leuven, Belgium

Volume

22

Issue

4

fYear

2012

fDate

4/1/2012 12:00:00 AM

Firstpage

215

Lastpage

217

Abstract

A novel nonlinear de-embedding procedure based on only the use of low- and high-frequency vector large-signal measurements is proposed. The nonlinear Q-V characteristics, along with the parasitic network, are here determined by combining vector measurements with numerical optimization. Consequently, the knowledge of their contributions allows one to retrieve the actual waveform at the current generator plane starting from any high-frequency load line.

Keywords

field effect transistors; power amplifiers; waveform generators; FET; active devices; current generator plane; high-frequency load line; high-frequency vector large-signal measurement; low-frequency vector large-signal measurement; nonlinear Q-V characteristics; numerical optimization; parasitic network; power amplifier; waveform-only-based nonlinear deembedding; Current measurement; FETs; Generators; Load modeling; Mathematical model; Optimization; Voltage measurement; ${rm I}$- ${rm V}$; ${rm Q}$-${rm V}$; LSNA; nonlinear de-embedding; optimization; vector large-signal measurements;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2012.2189375

Filename

6171877