• DocumentCode
    1473732
  • Title

    Fabrication tolerance of Ti:LiNbO3 waveguides

  • Author

    Chu, F.S. ; Liu, P.L. ; Baran, Jane E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
  • Volume
    8
  • Issue
    5
  • fYear
    1990
  • fDate
    5/1/1990 12:00:00 AM
  • Firstpage
    784
  • Lastpage
    788
  • Abstract
    A simulation program based on the three-dimensional beam propagation method (BPM) is used to study the fabrication conditions of single-mode Ti:LiNbO3 waveguides. The calculated cutoff wavelengths are in good agreement with experimental data. The thickness of titanium needed to support the fundamental and first-order modes for three Ti strip widths (6, 7, and 8 μm) is calculated. The two-dimensional BPM is used to calculate the coupling length from the fabrication conditions. Results are consistent with measured data. The fabrication tolerances of the coupling length of directional couplers are also presented
  • Keywords
    directional couplers; lithium compounds; optical couplers; optical waveguide theory; titanium; 3D beam propagation method; 6 micron; 7 micron; 8 micron; LiNbO3:Ti; coupling length; cutoff wavelengths; directional couplers; fabrication conditions; fabrication tolerances; first-order modes; fundamental modes; optical waveguides; simulation program; single-mode; strip widths; Eigenvalues and eigenfunctions; Equations; Fast Fourier transforms; Optical device fabrication; Optical refraction; Optical surface waves; Optical waveguides; Refractive index; Tellurium; Waveguide transitions;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.54488
  • Filename
    54488