DocumentCode
1473732
Title
Fabrication tolerance of Ti:LiNbO3 waveguides
Author
Chu, F.S. ; Liu, P.L. ; Baran, Jane E.
Author_Institution
Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
Volume
8
Issue
5
fYear
1990
fDate
5/1/1990 12:00:00 AM
Firstpage
784
Lastpage
788
Abstract
A simulation program based on the three-dimensional beam propagation method (BPM) is used to study the fabrication conditions of single-mode Ti:LiNbO3 waveguides. The calculated cutoff wavelengths are in good agreement with experimental data. The thickness of titanium needed to support the fundamental and first-order modes for three Ti strip widths (6, 7, and 8 μm) is calculated. The two-dimensional BPM is used to calculate the coupling length from the fabrication conditions. Results are consistent with measured data. The fabrication tolerances of the coupling length of directional couplers are also presented
Keywords
directional couplers; lithium compounds; optical couplers; optical waveguide theory; titanium; 3D beam propagation method; 6 micron; 7 micron; 8 micron; LiNbO3:Ti; coupling length; cutoff wavelengths; directional couplers; fabrication conditions; fabrication tolerances; first-order modes; fundamental modes; optical waveguides; simulation program; single-mode; strip widths; Eigenvalues and eigenfunctions; Equations; Fast Fourier transforms; Optical device fabrication; Optical refraction; Optical surface waves; Optical waveguides; Refractive index; Tellurium; Waveguide transitions;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/50.54488
Filename
54488
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