DocumentCode :
1473965
Title :
Finite-element method for the impedance analysis of traveling-wave modulators
Author :
Yi, Jong Chang ; Kim, Sun Ho ; Choi, Sang Sam
Author_Institution :
Appl. Opt. Lab., Korea Inst. of Sci. & Technol., Seoul, South Korea
Volume :
8
Issue :
6
fYear :
1990
fDate :
6/1/1990 12:00:00 AM
Firstpage :
817
Lastpage :
822
Abstract :
A low-frequency finite-element method (FEM) developed to calculate the impedance of multi-strip-line electrodes on traveling-wave modulators is discussed. In this method, the divergence theorem is used to evaluate the electrode capacitance from the node potential values of discrete elements. This method is used to calculate the impedance of electrodes on anisotropic-inhomogeneous dielectric media. The effect of nonzero electrode thickness and a groove excavated at the electrode gap is analyzed
Keywords :
capacitance; electric impedance; electro-optical devices; electrodes; finite element analysis; optical modulation; anisotropic-inhomogeneous dielectric media; discrete elements; divergence theorem; electrode capacitance; electrode gap; impedance analysis; low-frequency finite-element method; multi-strip-line electrodes; node potential values; nonzero electrode thickness; traveling-wave modulators; Anisotropic magnetoresistance; Bandwidth; Capacitance; Coplanar transmission lines; Dielectrics; Electrodes; Finite element methods; Impedance; Optical propagation; Strips;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.54497
Filename :
54497
Link To Document :
بازگشت