Finite-element method for the impedance analysis of traveling-wave modulators

Author

Yi, Jong Chang ; Kim, Sun Ho ; Choi, Sang Sam

Author_Institution

Appl. Opt. Lab., Korea Inst. of Sci. & Technol., Seoul, South Korea

Volume

8

Issue

6

fYear

1990

fDate

6/1/1990 12:00:00 AM

Firstpage

817

Lastpage

822

Abstract

A low-frequency finite-element method (FEM) developed to calculate the impedance of multi-strip-line electrodes on traveling-wave modulators is discussed. In this method, the divergence theorem is used to evaluate the electrode capacitance from the node potential values of discrete elements. This method is used to calculate the impedance of electrodes on anisotropic-inhomogeneous dielectric media. The effect of nonzero electrode thickness and a groove excavated at the electrode gap is analyzed

Keywords

capacitance; electric impedance; electro-optical devices; electrodes; finite element analysis; optical modulation; anisotropic-inhomogeneous dielectric media; discrete elements; divergence theorem; electrode capacitance; electrode gap; impedance analysis; low-frequency finite-element method; multi-strip-line electrodes; node potential values; nonzero electrode thickness; traveling-wave modulators; Anisotropic magnetoresistance; Bandwidth; Capacitance; Coplanar transmission lines; Dielectrics; Electrodes; Finite element methods; Impedance; Optical propagation; Strips;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.54497

Filename

54497