DocumentCode
1474001
Title
Discussion of "Impact of subcycle transfer switches on distribution system reliability" [and reply]
Author
Jipping, J.E. ; Carter, William E. ; Brown, Richard E. ; Ochoa, J.R.
Author_Institution
Detroit Edison Co., MI, USA
Volume
15
Issue
4
fYear
2000
Firstpage
1454
Lastpage
1455
Abstract
J.E. Jipping et al. comment on the paper by R.E. Brown et al. (see ibid., vol.15, no.1, p.442-7, 2000). They point out that the effect of voltage sags should be considered in reliability models. The original authors reply to the comments.
Keywords
power distribution reliability; power supply quality; switching; distribution system reliability; subcycle transfer switches; voltage sags; Circuit breakers; Circuit faults; Circuit testing; Power quality; Power system modeling; Power system reliability; Sociotechnical systems; Switches; System testing; Voltage fluctuations;
fLanguage
English
Journal_Title
Power Systems, IEEE Transactions on
Publisher
ieee
ISSN
0885-8950
Type
jour
DOI
10.1109/59.919218
Filename
919218
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