DocumentCode :
1474243
Title :
SAR Image Despeckling Using Bayesian Nonlocal Means Filter With Sigma Preselection
Author :
Zhong, Hua ; Li, Yongwei ; Jiao, Lc
Author_Institution :
Key Lab. of Intell. Perception & Image Understanding of theMinistry of Educ. of China, Xidian Univ., Xi´´an, China
Volume :
8
Issue :
4
fYear :
2011
fDate :
7/1/2011 12:00:00 AM
Firstpage :
809
Lastpage :
813
Abstract :
Bayesian nonlocal (NL) (BNL) means filter, as an extension of the NL means algorithm, provides a general framework for image denoising when dealing with different noise. However, this approach makes a strong assumption that image patch itself provides a good approximation on the true parameter, which leads to the bias problem particularly under serious speckle noise. Another disadvantage of the BNL filter is that the commonly used patch preselection method cannot effectively exclude the outliers. In this letter, a new form of the BNL filter is presented for the purpose of synthetic aperture radar image despeckling, which incorporates the technique of sigma filter to cope with the bias problem. In addition, pixel preselection is adopted based on the refined sigma range, which greatly contributes to the preservation of the image details such as edges, texture, and the strong reflective scatters. Experimental results illustrate that the proposed BNL filter reaches the state-of-the-art performance on both the visual quality and evaluation indexes.
Keywords :
Gaussian noise; filtering theory; image denoising; image enhancement; radar imaging; synthetic aperture radar; Bayesian nonlocal means filter; SAR image despeckling; image denoising; patch preselection method; sigma filter; sigma preselection; speckle noise; synthetic aperture radar; Bayesian methods; Estimation; Image edge detection; Noise measurement; Pixel; Smoothing methods; Speckle; Bayesian nonlocal (NL) (BNL) means; despeckling; sigma filter; synthetic aperture radar (SAR);
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
Publisher :
ieee
ISSN :
1545-598X
Type :
jour
DOI :
10.1109/LGRS.2011.2112331
Filename :
5733366
Link To Document :
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