Title :
Wide-bandwidth receiver photodetector frequency response measurements using amplified spontaneous emission from a semiconductor optical amplifier
Author :
Eichen, Elliot ; Schlafer, John ; Rideout, William ; McCabe, John
Author_Institution :
GTE Lab. Inc., Waltham, MA, USA
fDate :
6/1/1990 12:00:00 AM
Abstract :
The white optical noise (spontaneous-spontaneous beat noise) generated by amplified spontaneous emission from a semiconductor-optical amplifier is used to measure the frequency response of over-wide-bandwidth photodetectors and optical receivers. This technique can be used to characterize optoelectronic components of arbitrarily wide bandwidths
Keywords :
optical variables measurement; photodetectors; receivers; semiconductor junction lasers; superradiance; white noise; amplified spontaneous emission; optical receivers; optoelectronic components; over-wide-bandwidth photodetectors; photodetector frequency response measurements; receiver frequency response measurements; semiconductor optical amplifier; spontaneous-spontaneous beat noise; white optical noise; Broadband amplifiers; Frequency measurement; Frequency response; Noise generators; Optical noise; Optical receivers; Photodetectors; Semiconductor device noise; Semiconductor optical amplifiers; Spontaneous emission;
Journal_Title :
Lightwave Technology, Journal of
