DocumentCode :
1474313
Title :
Unipolar Organic Transistor Circuits Made Robust by Dual-Gate Technology
Author :
Myny, Kris ; Beenhakkers, Monique J. ; Van Aerle, Nick A J M ; Gelinck, Gerwin H. ; Genoe, Jan ; Dehaene, Wim ; Heremans, Paul
Author_Institution :
IMEC, Leuven, Belgium
Volume :
46
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
1223
Lastpage :
1230
Abstract :
Dual-gate organic transistor technology is used to increase the robustness of digital circuits as illustrated by higher inverter gains and noise margins. The additional gate in the technology functions as a VT-control gate. Both zero-VGS-load and diode-load logic are investigated. The noise margin of zero- VGS-load inverter increases from 1.15 V (single gate) to 2.8 V (dual gate) at 20 V supply voltage. Diode-load logic inverters show an improvement in noise margin from ~0 V to 0.7 V for single gate and dual gate inverters, respectively. These values can be increased significantly by optimizing the inverter topologies. As a result of this optimization, noise margins larger than 6 V for zero- VGS-load logic and 1.4 V for diode-load logic are obtained. Functional 99-stage ring oscillators with 2.27 μs stage delays and 64 bit organic RFID transponder chips, operating at a data rate of 4.3 kb/s, have been manufactured.
Keywords :
bipolar transistor circuits; invertors; logic circuits; network topology; radiofrequency identification; radiofrequency integrated circuits; diode-load logic; dual-gate technology; unipolar organic transistor circuits; voltage 1.15 V; voltage 1.4 V; voltage 2.8 V; voltage 20 V; zero-VGS-load; Inverters; Logic gates; Noise; Threshold voltage; Topology; Transistors; Transponders; Dual-gate; organic RFID; organic circuits; organic transistor;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2011.2116490
Filename :
5733376
Link To Document :
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