DocumentCode
1474406
Title
Parallel Time-Domain Finite-Element Simulator of Linear Speedup and Electromagnetic Accuracy for the Simulation of Die–Package Interaction
Author
Chen, Duo ; Jiao, Dan ; Koh, Cheng-Kok
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
1
Issue
5
fYear
2011
fDate
5/1/2011 12:00:00 AM
Firstpage
752
Lastpage
760
Abstract
In this paper, we develop an almost embarrassingly parallel solution to an electromagnetic solver of linear complexity for overcoming the grand challenge of performing electromagnetically accurate co-simulation of die-package interaction. In this solution, through suitable basis functions and linear algebraic techniques, we directly and rigorously decompose the system matrix in a 3-D space to multiple matrices of 1-D sizes with negligible computational overhead. Each 1-D matrix is made tridiagonal and, hence, can be solved readily in linear complexity. We then achieve an almost embarrassingly parallel implementation of the fast electromagnetic solver with a low communication-to-computation ratio. Numerical experiments on a large-scale combined die-package system, involving more than 3.5 billion unknowns, have demonstrated superior performance of the proposed parallel transient simulator for simulating large-scale integrated circuits and package problems. In addition, the proposed solver is applicable to any arbitrarily shaped multilayer structure embedded in inhomogeneous materials.
Keywords
finite element analysis; integrated circuit packaging; large scale integration; matrix decomposition; time-domain analysis; communication-to-computation ratio; die-package interaction; electromagnetic accuracy; electromagnetic solver; large-scale integrated circuit; linear algebraic technique; linear complexity; linear speedup; matrix decomposition; parallel time-domain finite-element simulator; parallel transient simulator; Complexity theory; Electromagnetics; Integrated circuit modeling; Matrix decomposition; Nickel; Vectors; Electromagnetic analysis; finite-element methods; multicore; on-chip; package; parallel computing; transient simulation;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2011.2111418
Filename
5733389
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