Title :
Shelf-Life Study of Ag/NiNiP-Plated Cu Leadframes Without Anti-Tarnish Coating
Author_Institution :
Infineon Technol. Asia Pacific Pte Ltd., Singapore, Singapore
fDate :
4/1/2011 12:00:00 AM
Abstract :
An Ag spot/full nickel and nickel phosphorus (NiNiP)-plated Cu leadframe without the anti-tarnish layer was used for aluminum wire bonding in power packages. Two periods of shelf-life, namely 7 months and 13 months, of the leadframe were studied in terms of processability (die attachment and wire bonding) and package reliability. It was found that the leadframe with 7-month shelf-life showed positive results for both processability and package reliability. The leadframe with 13-month shelf-life showed positive results for processability. However, it showed delamination at the leads between the NiNiP leadframe surface and the molding compound interface after high-temperature storage for 1000 h. Further analysis showed that the delamination is related to Ni diffusion into the interface of the NiP/molding compound and S in the molding compound during the reliability test.
Keywords :
aluminium; copper; delamination; integrated circuit packaging; integrated circuit reliability; lead bonding; moulding; nickel compounds; silver; Ag-NiNiP; Cu; NiNiP leadframe surface; aluminum wire bonding; antitarnish coating; copper Leadframe; delamination; die attachment; high-temperature storage; molding compound interface; nickel phosphorus; package reliability; power package; shelf-life study; Compounds; Copper; Delamination; Lead; Nickel; Surface treatment; Wire; Copper; integrated circuits packaging; leadframe; nickel; nickel phosphorus; shelf-life; silver;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2010.2103563