• DocumentCode
    1474411
  • Title

    Shelf-Life Study of Ag/NiNiP-Plated Cu Leadframes Without Anti-Tarnish Coating

  • Author

    Li, Wu-Hu

  • Author_Institution
    Infineon Technol. Asia Pacific Pte Ltd., Singapore, Singapore
  • Volume
    1
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    622
  • Lastpage
    629
  • Abstract
    An Ag spot/full nickel and nickel phosphorus (NiNiP)-plated Cu leadframe without the anti-tarnish layer was used for aluminum wire bonding in power packages. Two periods of shelf-life, namely 7 months and 13 months, of the leadframe were studied in terms of processability (die attachment and wire bonding) and package reliability. It was found that the leadframe with 7-month shelf-life showed positive results for both processability and package reliability. The leadframe with 13-month shelf-life showed positive results for processability. However, it showed delamination at the leads between the NiNiP leadframe surface and the molding compound interface after high-temperature storage for 1000 h. Further analysis showed that the delamination is related to Ni diffusion into the interface of the NiP/molding compound and S in the molding compound during the reliability test.
  • Keywords
    aluminium; copper; delamination; integrated circuit packaging; integrated circuit reliability; lead bonding; moulding; nickel compounds; silver; Ag-NiNiP; Cu; NiNiP leadframe surface; aluminum wire bonding; antitarnish coating; copper Leadframe; delamination; die attachment; high-temperature storage; molding compound interface; nickel phosphorus; package reliability; power package; shelf-life study; Compounds; Copper; Delamination; Lead; Nickel; Surface treatment; Wire; Copper; integrated circuits packaging; leadframe; nickel; nickel phosphorus; shelf-life; silver;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2010.2103563
  • Filename
    5733390