DocumentCode :
1474421
Title :
An efficient algorithm-based fault tolerance design using the weighted data-check relationship
Author :
Youn, Hee Yong ; Oh, Choong Gun ; Choo, Hyunseung ; Chung, Jin-Wook ; Lee, Dongman
Author_Institution :
Sch. of Electr. & Comput. Eng., Sung Kyun Kwan Univ., Suwon, South Korea
Volume :
50
Issue :
4
fYear :
2001
fDate :
4/1/2001 12:00:00 AM
Firstpage :
371
Lastpage :
383
Abstract :
VLSI-based processor arrays have been widely used for computation intensive applications such as matrix and graph algorithms. Algorithm-based fault tolerance designs employing various encoding/decoding schemes have been proposed for such systems to effectively tolerate operation time fault. In this paper, we propose an efficient algorithm-based fault tolerance design using the weighted data-check relationship, where the checks are obtained from the weighted data. The relationship is systematically defined as a new (n, k, Nw ) Hamming checksum code, where n is the size of the code word, k is the number of information elements in the code word, and Nw is the number of weights employed, respectively. The proposed design with various weights is evaluated in terms of time and hardware overhead as well as overflow probability and round-off error. Two different schemes employing the (n, k, 2) and (n, k, 3) Hamming checksum code are illustrated using important matrix computations. Comparison with other schemes reveals that the (n, k, 3) Hamming checksum scheme is very efficient, while the hardware overhead is small
Keywords :
Hamming codes; error correction codes; fault tolerant computing; parallel processing; roundoff errors; Hamming checksum code; Hamming checksum scheme; VLSI-based processor arrays; algorithm-based fault tolerance design; decoding; encoding; hardware overhead; matrix computations; round-off error; weighted data-check relationship; Algorithm design and analysis; Computer Society; Computer applications; Decoding; Encoding; Fault tolerance; Fault tolerant systems; Hardware; Roundoff errors; Very large scale integration;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.919281
Filename :
919281
Link To Document :
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