• DocumentCode
    1474695
  • Title

    Sigma-delta A/D converter in HTS ramp edge technology

  • Author

    Sonnenberg, A.H. ; Oomen, I. ; Hilgenkamp, H. ; Gerritsma, G.J. ; Rogalla, H.

  • Author_Institution
    Div. of Low Temp., Twente Univ., Enschede, Netherlands
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    200
  • Lastpage
    204
  • Abstract
    We have successfully fabricated and tested a high temperature superconducting sigma-delta A/D converter, The quantizer is a balanced comparator that has been characterized separately in two temperature regimes. The circuits have been fabricated with ramp edge junctions with a PrBaCuCaO-barrier on a buried ground plane. For the current to voltage conversion in the sigma-delta converter we fabricated a 50 mOhm resistor with an in-situ gold layer, The sigma-delta converter has been tested at an internal clock of up to 174 GHz. The signal-to-noise ratio has been measured at a relatively low frequency of 3.4 kHz and was at least 63 dB but most likely higher since the measurement was limited by the noise in the amplifiers, As a first attempt towards the development of a decimation filter we have fabricated and tested a toggle flip-flop. The toggle flip-flop has been tested successfully at 40 K up to a frequency of 33 GHz, which corresponds to 70% of the IcRn-product of a reference junction
  • Keywords
    high-temperature superconductors; sigma-delta modulation; superconducting microwave devices; superconducting mixers; 174 GHz; 33 GHz; 40 K; HTS ramp edge technology; PrBaCuCaO-barrier; buried ground plane; current to voltage conversion; high temperature superconductor; ramp edge junctions; sigma-delta A/D converter; signal-to-noise ratio; Circuit testing; Delta-sigma modulation; Flip-flops; Frequency measurement; High temperature superconductors; Josephson junctions; Land surface temperature; Noise measurement; Signal to noise ratio; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919319
  • Filename
    919319