DocumentCode :
1474745
Title :
Study of trapped flux in a superconducting thin film-observation by scanning SQUID microscope and simulation
Author :
Tanaka, Keiichi ; Morooka, Toshimitsu ; Odawara, Akikazu ; Mawatari, Yasunori ; Nakayama, Satoshi ; Nagata, Atsushi ; Ikeda, Masanori ; Chinone, Kazuo ; Koyanagi, Masao
Author_Institution :
Sieko Instrum. Inc., Chiba, Japan
Volume :
11
Issue :
1
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
230
Lastpage :
233
Abstract :
Flux trapping in superconducting devices, such as Josephson circuits and SQUIDs is a major cause for degradation of device performance. Intentionally made holes and moats in superconducting films were previously found effective in overcoming the effects of flux trapping. Despite the need for a design rule for the arrangement of holes or moats, comparison between experiment and theory of the flux trapping locations has not yet been discussed. We therefore studied the locations of trapped fluxes in a superconducting thin film cooled at a rate of 0.02 K/sec for various external magnetic flux densities from 1 μT to 3 μT by using a scanning SQUID microscope. Trapped fluxes were observed at positions where holes were prepared in the superconducting film and also at superconducting locations outside the holes. Trapped fluxes outside the holes were orderly arranged regardless of magnetic flux density during cooling. These locations were then compared with those determined by simulations based on a model that considers both the surface barrier effect introduced by Bean and Livingston and the interaction among fluxes. The simulation shows that the potential wells appear below the transition temperature, corresponding to the trapped fluxes outside holes
Keywords :
SQUID magnetometers; flux pinning; superconducting thin films; 1 to 3 muT; Josephson circuits; flux trapping; holes; magnetic flux density; moats; scanning SQUID microscopy; simulation; superconducting thin film; surface barrier effect; transition temperature; trapped flux; Circuits; Cooling; Degradation; Magnetic flux density; Magnetic force microscopy; SQUIDs; Superconducting devices; Superconducting films; Superconducting thin films; Superconducting transition temperature;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.919326
Filename :
919326
Link To Document :
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