Title :
Testing logic-intensive memory ICs on memory testers
Author :
Wu, Robert ; Gerner, Jerry ; Weelus, R. ; Lew, Kevin
Author_Institution :
Fast Static RAM Div., Motorola, MD, USA
Abstract :
Presents Lotom, a tool which converts logic test vectors into memory test patterns and generates a corresponding memory test program for use on an economical memory tester. The authors report a sample time savings of 99% over manual conversion
Keywords :
integrated circuit testing; integrated memory circuits; logic testing; Lotom; logic test vectors; memory ICs; memory test patterns; memory test program; memory testers; Built-in self-test; Circuit testing; Costs; Cyclic redundancy check; Electronic equipment testing; Integrated circuit testing; Logic testing; Pins; Software testing; Test pattern generators;
Journal_Title :
Design & Test of Computers, IEEE
