• DocumentCode
    1474851
  • Title

    Rectangular waveguide characterization for reflectometry

  • Author

    Hunter, John D. ; Somlo, P.I.

  • Author_Institution
    Nat. Meas. Lab., Lindfield, NSW, Australia
  • Volume
    37
  • Issue
    3
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    439
  • Lastpage
    443
  • Abstract
    Simple first-order correction formulas are developed to describe the combined effect of wall distortion and wall loss on the propagation constant and normalized impedance of nominally rectangular waveguides intended for use in reflectometry. A simple method of measuring the propagation constant at a single frequency is described, resulting in practical advantages in characterization of the waveguide at other frequencies
  • Keywords
    calibration; microwave reflectometry; rectangular waveguides; first-order correction formulas; microwave measurement; nominally rectangular waveguides; normalized impedance; propagation constant; reflectometry; wall distortion; wall loss; Calibration; Flanges; Frequency measurement; Impedance; Propagation constant; Propagation losses; Rectangular waveguides; Reflection; Reflectometry; Waveguide junctions;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.7471
  • Filename
    7471
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1474851