DocumentCode :
1474977
Title :
Frequency-response measurements on silicon planar transistors
Author :
Whitfield, G.R.
Volume :
36
Issue :
6
fYear :
1968
fDate :
12/1/1968 12:00:00 AM
Firstpage :
335
Lastpage :
340
Abstract :
This paper describes convenient laboratory methods of measuring the hybrid ¿ parameters as a function of collector current. Typical results are given, and the variation of the transition frequency with collector current is discussed.
Keywords :
bipolar transistors; semiconductor device models;
fLanguage :
English
Journal_Title :
Radio and Electronic Engineer
Publisher :
iet
ISSN :
0033-7722
Type :
jour
DOI :
10.1049/ree.1968.0115
Filename :
5267310
Link To Document :
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