• DocumentCode
    1475045
  • Title

    Spread of critical currents in thin-film YBa2Cu3 O7-x bicrystal junctions

  • Author

    Shadrin, Pavel ; Divin, Yuri

  • Author_Institution
    Inst. of Solid-State Phys., Juelich Res. Centre, Juelich, Germany
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    414
  • Lastpage
    417
  • Abstract
    A spread of the critical currents in a series array of up to 100 YBa2Cu3O7-x bicrystal junctions has been studied by Laser Scanning Microscopy. The values of the critical current Ic of individual junctions in the array have been obtained by focusing a laser beam on each junction and measuring the current at which the maximum laser-induced voltage response ΛV on the array has appeared. The distribution of critical currents in logarithmic scale was close to a Gaussian one. The Ic-spread has been found to increase with the increase of misorientation angle of bicrystal substrate and the decrease of the width of the junctions in the array
  • Keywords
    Josephson effect; barium compounds; bicrystals; critical currents; high-temperature superconductors; superconducting arrays; superconducting thin films; yttrium compounds; YBa2Cu3O7-x thin film bicrystal junction; YBa2Cu3O7; critical current; grain boundary Josephson junction; laser scanning microscopy; local probing; misorientation angle; series array; Atomic force microscopy; Critical current; Grain boundaries; High temperature superconductors; Optical arrays; Optical device fabrication; Semiconductor laser arrays; Substrates; Surfaces; Transistors;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919371
  • Filename
    919371
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1475045