Title :
Low error operation of a 4 stage single flux quantum shift register built with Y-Ba-Cu-O bicrystal Josephson junctions
Author :
Park, J.H. ; Kang, J.H. ; Jung, T.B. ; Jung, K.R. ; Kim, C.H. ; Kim, Y.H. ; Choi, S.S. ; Hahn, T.S.
Author_Institution :
Korea Inst. of Sci. & Technol., Seoul, South Korea
fDate :
3/1/2001 12:00:00 AM
Abstract :
We fabricated a 4 stage single flux quantum shift register with YBa2Cu3Ox (YBCO) bicrystal Josephson junctions and demonstrated the circuit´s low error operation by using a computer controlled digital measurement set-up. The circuit was operated at 65 K. Binary data sequences of “1000”, “1010”, “1011,” and “1111” were successfully loaded and shifted in the circuit. The two read SQUIDs placed next to each side of the shift register were used to sense all the individual data states. By operating the circuit with the proper current pulses, we observed no errors during 16 hours, which is equivalent to 21,000 error-free data shifts. We also found that temperature dependent inductance and junction critical currents limit the operating temperature range of the circuit, and the effective thermal noise temperature can be lower than 100 K
Keywords :
Josephson effect; barium compounds; bicrystals; high-temperature superconductors; shift registers; superconducting logic circuits; yttrium compounds; 65 K; SQUID readout; YBCO bicrystal Josephson junction; YBa2Cu3O; binary data sequence; computer controlled digital measurement; critical current; inductance; low error operation; multistage single flux quantum shift register; superconducting device; temperature dependence; thermal noise; Circuits; Computer errors; Error correction; Josephson junctions; Quantum computing; Shift registers; Temperature dependence; Temperature distribution; Temperature sensors; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on