• DocumentCode
    1475681
  • Title

    Characterization of HTS SFQ circuits using interface-engineered Josephson junctions

  • Author

    Saitoh, K. ; Soutome, Y. ; Fukazawa, T. ; Tarutani, Y. ; Takagi, K.

  • Author_Institution
    Adv. Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    791
  • Lastpage
    794
  • Abstract
    We fabricated and tested high-temperature superconducting (HTS) rapid-single-flux-quantum (RSFQ) circuits using interface-engineered Josephson junction (IEJ). The characteristics of high-speed operation were examined by voltage-divider operation based on the toggle-flip-flop circuit. An operation at 155 GHz was obtained at 15 K and the proper functioning of the voltage divider was observed up to 27 K. Temperature dependence of the maximum operation speed was analyzed by circuit simulation with thermal-noise sources. To achieve higher speed operation using a Josephson junction with a higher IcRn product, we also fabricated an RSFQ balanced comparator using IEJ; proper switching characteristics of the circuit was confirmed up to 190 GHz at 30 K. The bias condition dependencies were studied based on the circuit simulations in the relationship of the IcRn product. The results of circuit simulation indicate that a Josephson junction with an IcRn product of more than 0.7 mV is required for high-speed operation (100 GHz) in high-temperature range (30-40 K). We believe that the IEJ is a promising junction candidate for realizing high-speed operation in a high-temperature range
  • Keywords
    Josephson effect; comparators (circuits); flip-flops; high-temperature superconductors; superconducting integrated circuits; voltage dividers; 100 GHz; 15 to 40 K; 155 GHz; 190 GHz; RSFQ circuit; balanced comparator; circuit simulation; critical current-normal resistance product; high temperature superconductor; high-speed operation; interface engineered Josephson junction; temperature dependence; thermal noise; toggle flip-flop; voltage divider; Circuit simulation; Circuit testing; High temperature superconductors; Josephson junctions; Rough surfaces; Superconductivity; Surface cleaning; Surface roughness; Voltage; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919464
  • Filename
    919464