Test sequencing problems arising in test planning and design for testability

Author

Raghavan, Vijaya ; Shakeri, Mojdeh ; Pattipati, Krishna R.

Author_Institution

Mathworks Inc., Natick, MA, USA

Volume

29

Issue

2

fYear

1999

fDate

3/1/1999 12:00:00 AM

Firstpage

153

Lastpage

163

Abstract

We consider four test sequencing problems that frequently arise in test planning and design for testability (DFT) processes. Specifically, we consider the following problems: (1) how to determine a test sequence that does not depend on the failure probability distribution; (2) how to determine a test sequence that minimizes expected testing cost while not exceeding a given testing time; (3) how to determine a test sequence that does not utilize more than a given number of tests, while minimizing the average ambiguity group size; and (4) how to determine a test sequence that minimizes the storage cost of tests in the diagnostic strategy. We present various solution approaches to solve the above problems and illustrate the usefulness of the proposed algorithms

Keywords

design for testability; dynamic programming; fault diagnosis; graph theory; information theory; minimisation; probability; search problems; average ambiguity group size; design for testability; diagnostic strategy; expected testing cost; storage cost; test planning; test sequencing problems; testing time; Costs; Design for testability; Dictionaries; Minimax techniques; Power generation economics; Probability distribution; Process planning; System testing; Systems engineering and theory; Time measurement;

fLanguage

English

Journal_Title

Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on

Publisher

ieee

ISSN

1083-4427

Type

jour

DOI

10.1109/3468.747850

Filename

747850