DocumentCode :
1475868
Title :
Robust Secure Scan Design Against Scan-Based Differential Cryptanalysis
Author :
Youhua Shi ; Togawa, N. ; Yanagisawa, M. ; Ohtsuki, Tomoaki
Author_Institution :
Fac. of Sci. & Eng., Waseda Univ., Tokyo, Japan
Volume :
20
Issue :
1
fYear :
2012
Firstpage :
176
Lastpage :
181
Abstract :
Scan technology carries the potential risk of being misused as a “side channel” to leak out the secrets of crypto cores. The existing scan-based attacks could be viewed as one kind of differential cryptanalysis, which takes advantages of scan chains to observe the bit changes between pairs of chosen plaintexts so as to identify the secret keys. To address such a design/test challenge, this paper proposes a robust secure scan structure design for crypto cores as a countermeasure against scan-based attacks to maintain high security without compromising the testability.
Keywords :
cryptography; crypto cores; design-test challenge; plaintexts; robust secure scan design; scan chains; scan-based attacks; scan-based differential cryptanalysis; secret keys; side channel; Computer hacking; Elliptic curve cryptography; Hardware; Registers; Robustness; Crypto hardware; differential cryptanalysis; scan-based discrete Fourier transform (DFT); security; side channel attack; testability;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2011.2120635
Filename :
5734887
Link To Document :
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