DocumentCode
1475868
Title
Robust Secure Scan Design Against Scan-Based Differential Cryptanalysis
Author
Youhua Shi ; Togawa, N. ; Yanagisawa, M. ; Ohtsuki, Tomoaki
Author_Institution
Fac. of Sci. & Eng., Waseda Univ., Tokyo, Japan
Volume
20
Issue
1
fYear
2012
Firstpage
176
Lastpage
181
Abstract
Scan technology carries the potential risk of being misused as a “side channel” to leak out the secrets of crypto cores. The existing scan-based attacks could be viewed as one kind of differential cryptanalysis, which takes advantages of scan chains to observe the bit changes between pairs of chosen plaintexts so as to identify the secret keys. To address such a design/test challenge, this paper proposes a robust secure scan structure design for crypto cores as a countermeasure against scan-based attacks to maintain high security without compromising the testability.
Keywords
cryptography; crypto cores; design-test challenge; plaintexts; robust secure scan design; scan chains; scan-based attacks; scan-based differential cryptanalysis; secret keys; side channel; Computer hacking; Elliptic curve cryptography; Hardware; Registers; Robustness; Crypto hardware; differential cryptanalysis; scan-based discrete Fourier transform (DFT); security; side channel attack; testability;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2011.2120635
Filename
5734887
Link To Document