DocumentCode
1475884
Title
Engineering Chain: A Novel Semiconductor Engineering Collaboration Model
Author
Cheng, Fan-tien ; Chen, Ying-Liang ; Chang, Jonathan Yung-Cheng
Author_Institution
Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume
25
Issue
3
fYear
2012
Firstpage
394
Lastpage
407
Abstract
As an integrated circuit (IC) design house adopts a new semiconductor manufacturing technology for a new IC design, the failure rate and design cycle of the new technology are much higher than those of the mature technologies. Consequently, shortening the IC design cycle of a new technology becomes more difficult since a design house needs to finish the design with more complicated processes in a shorter cycle time. IC suppliers will lose their competition and market if they cannot cut the cycle time from IC design to IC mass-production. This paper proposes a novel engineering-chain (EC) collaboration model to formulate this high-IC-design-failure-rate and long-IC-design-cycle problem. The goals of EC are improving IC-design success rate, reducing cycle time, and increasing revenue. This paper also proposes an engineering chain management system (ECMS) to help achieve the goals of EC. In order to accommodate the EC requirements, it is required to extend the existing computer-integrated-manufacturing scope of a foundry from single-factor operating control to cross-industry operating control. This paper applies the concept of framework to design the ECMS and adopts the new-generation interoperable document-centric computing technology, webservices, as the enabling technology for the communication interface of the ECMS framework. All of the EC-related concepts and requirements are well established in this paper and the ECMS is a linkage of these concepts into a single business process to achieve the EC goals.
Keywords
Web services; computer integrated manufacturing; failure analysis; integrated circuit design; integrated circuit manufacture; semiconductor device manufacture; Web services; communication interface; complicated processes; computer-integrated-manufacturing scope; cross-industry operating control; engineering chain management system; failure rate; foundry; integrated circuit design; integrated circuit mass-production; interoperable document-centric computing technology; semiconductor engineering collaboration; semiconductor manufacturing technology; shorter cycle time; single-factor operating control; Collaboration; Consumer electronics; Electronic countermeasures; Electronics industry; Integrated circuit modeling; Manufacturing; Computer integrated manufacturing (CIM); design for manufacturing (DFM); engineering chain (EC); engineering chain management system (ECMS);
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/TSM.2012.2191626
Filename
6172590
Link To Document