• DocumentCode
    1476375
  • Title

    Temperature dependence of the Josephson linewidth of resistively shunted double junction HTS SQUIDs

  • Author

    Peden, D.A. ; Hao, L. ; Macfarlane, J.C. ; Lee, R.A.M. ; Gallop, J.C.

  • Author_Institution
    Centre for Basic, Thermal & Lengh Metrol., Nat. Phys. Lab., Teddington, UK
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    1215
  • Lastpage
    1218
  • Abstract
    Double Josephson junction HTS resistive SQUIDs have been fabricated using an on-chip shunt Au resistor across a gap in an YBa2Cu3O7-δ loop, providing a low shunt resistance of Rs ~26 μΩ at T⩽77 K. The dependence of the heterodyne oscillation linewidth of the R-SQUID on the thermal noise across the shunt resistor is under investigation with a view to the development of an absolute noise thermometer. Signal powers ~nW have been measured and the device has been shown to be tunable from 5 to 50 MHz. The measured oscillation linewidth (~30 kHz at 17 K) is believed to be the narrowest reported for such an HTS device, however non-thermal broadening of the linewidth is also observed, as has been reported for single junctions at GHz frequencies. We describe measurements on such devices over a range of temperatures and bias conditions
  • Keywords
    Josephson effect; SQUIDs; barium compounds; electric noise measurement; high-temperature superconductors; superconducting device noise; thermal noise; yttrium compounds; 20 to 77 K; 5 to 50 MHz; Au; Josephson linewidth; YBa2Cu3O7-δ loop; YBa2Cu3O7; absolute noise thermometer; heterodyne oscillation linewidth; low shunt resistance; nonthermal linewidth broadening; on-chip shunt Au resistor; oscillation linewidth; resistively shunted double junction HTS SQUID; signal powers; temperature dependence; thermal noise; tunable device; Electrical resistance measurement; Frequency measurement; Gold; High temperature superconductors; Josephson junctions; Resistors; SQUIDs; Temperature dependence; Temperature distribution; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919568
  • Filename
    919568