Title :
Non-destructive testing using a HTS SQUID
Author :
Nakane, Hideaki ; Kabasawa, Ryo ; Adachi, Hiroshi
Author_Institution :
Dept. of Electr. & Electron. Eng., Muroran Inst. of Technol., Hokkaido, Japan
fDate :
3/1/2001 12:00:00 AM
Abstract :
We have used a high temperature superconductor (HTS) SQUID in an unshielded environment to perform eddy current nondestructive testing measurement of a multi-layer aluminum structure. The sensor consists of an YBCO dc superconducting quantum interference device (SQUID). As a demonstration of the system´s capabilities, subsurface defects in a multi-layer aluminum structure have been located and mapped using eddy current with no magnetic shielding around the specimen
Keywords :
SQUIDs; eddy current testing; Al; HTS SQUID; YBCO; YBaCuO; eddy current nondestructive testing measurement; high temperature superconductor; multi-layer aluminum structure; nondestructive testing; subsurface defect; Aluminum; Current measurement; Eddy currents; High temperature superconductors; Magnetic sensors; Nondestructive testing; Performance evaluation; SQUIDs; Superconducting devices; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
