DocumentCode
1476512
Title
Non-destructive testing using a HTS SQUID
Author
Nakane, Hideaki ; Kabasawa, Ryo ; Adachi, Hiroshi
Author_Institution
Dept. of Electr. & Electron. Eng., Muroran Inst. of Technol., Hokkaido, Japan
Volume
11
Issue
1
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
1291
Lastpage
1294
Abstract
We have used a high temperature superconductor (HTS) SQUID in an unshielded environment to perform eddy current nondestructive testing measurement of a multi-layer aluminum structure. The sensor consists of an YBCO dc superconducting quantum interference device (SQUID). As a demonstration of the system´s capabilities, subsurface defects in a multi-layer aluminum structure have been located and mapped using eddy current with no magnetic shielding around the specimen
Keywords
SQUIDs; eddy current testing; Al; HTS SQUID; YBCO; YBaCuO; eddy current nondestructive testing measurement; high temperature superconductor; multi-layer aluminum structure; nondestructive testing; subsurface defect; Aluminum; Current measurement; Eddy currents; High temperature superconductors; Magnetic sensors; Nondestructive testing; Performance evaluation; SQUIDs; Superconducting devices; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.919586
Filename
919586
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