• DocumentCode
    1476746
  • Title

    Creating small fault dictionaries [logic circuit fault diagnosis]

  • Author

    Chess, Brian ; Larrabee, Tracy

  • Author_Institution
    Hewlett-Packard Co., Palo Alto, CA, USA
  • Volume
    18
  • Issue
    3
  • fYear
    1999
  • fDate
    3/1/1999 12:00:00 AM
  • Firstpage
    346
  • Lastpage
    356
  • Abstract
    Diagnostic fault simulation can generate enormous amounts of data. The techniques used to manage this data can have significant effect on the outcome of the fault diagnosis procedure. We first demonstrate that if information is removed from a fault dictionary, its ability to diagnose unmodeled faults may be severely curtailed even if dictionary quality metrics remain unaffected; we, therefore, focus on methods for producing small, lossless dictionaries, We present a new dictionary organization based on error sets, which is amenable to standard data-compression techniques. We compare several dictionary organizations and the effect of standard data-compression techniques on each of them. An appropriate organization and encoding makes dictionary-based diagnosis practical for very large circuits
  • Keywords
    circuit analysis computing; data compression; fault diagnosis; fault simulation; integrated circuit testing; integrated logic circuits; logic testing; data-compression techniques; diagnostic fault simulation; dictionary organization; dictionary-based diagnosis; encoding; error sets; fault diagnosis; fault dictionaries; small lossless dictionaries; very large circuits; CMOS technology; Circuit faults; Circuit testing; Dictionaries; Failure analysis; Fault diagnosis; Manufacturing processes; Production; Standards organizations; Wire;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.748164
  • Filename
    748164