DocumentCode
1476746
Title
Creating small fault dictionaries [logic circuit fault diagnosis]
Author
Chess, Brian ; Larrabee, Tracy
Author_Institution
Hewlett-Packard Co., Palo Alto, CA, USA
Volume
18
Issue
3
fYear
1999
fDate
3/1/1999 12:00:00 AM
Firstpage
346
Lastpage
356
Abstract
Diagnostic fault simulation can generate enormous amounts of data. The techniques used to manage this data can have significant effect on the outcome of the fault diagnosis procedure. We first demonstrate that if information is removed from a fault dictionary, its ability to diagnose unmodeled faults may be severely curtailed even if dictionary quality metrics remain unaffected; we, therefore, focus on methods for producing small, lossless dictionaries, We present a new dictionary organization based on error sets, which is amenable to standard data-compression techniques. We compare several dictionary organizations and the effect of standard data-compression techniques on each of them. An appropriate organization and encoding makes dictionary-based diagnosis practical for very large circuits
Keywords
circuit analysis computing; data compression; fault diagnosis; fault simulation; integrated circuit testing; integrated logic circuits; logic testing; data-compression techniques; diagnostic fault simulation; dictionary organization; dictionary-based diagnosis; encoding; error sets; fault diagnosis; fault dictionaries; small lossless dictionaries; very large circuits; CMOS technology; Circuit faults; Circuit testing; Dictionaries; Failure analysis; Fault diagnosis; Manufacturing processes; Production; Standards organizations; Wire;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.748164
Filename
748164
Link To Document