• DocumentCode
    1476954
  • Title

    Intermodulation distortion and Josephson vortices in YBCO bicrystal grain boundaries

  • Author

    Oates, Daniel E. ; Xin, Hao ; Dresselhaus, Gene ; Dresselhaus, Mildred S.

  • Author_Institution
    Lincoln Lab., MIT, Lexington, MA, USA
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    2804
  • Lastpage
    2807
  • Abstract
    The properties of grain boundaries at microwave-frequencies in the high-Tc materials are of interest for both practical applications and basic physics. We report the measurements of intermodulation distortion (IMD) in engineered grain boundaries in YBCO films fabricated on sapphire bicrystals with misorientation angles of 0, 2, 5, 7.5, 10 and 24°. The measurements indicate that low-angle grain boundaries are not the source of IMD in epitaxial films. We also report the microwave response of YBCO 24° bicrystal grain boundaries to small dc magnetic fields, from 0 to 10 Oe. Peaks in the microwave loss as high as 5 times the baseline values at certain dc magnetic fields are observed. The losses result from individual Josephson vortices penetrating into the grain-boundary which is modeled as a long Josephson junction. Excellent quantitative agreement between the experimental data and the model has been obtained for the case of the increasing field
  • Keywords
    Josephson effect; barium compounds; bicrystals; grain boundaries; high-temperature superconductors; intermodulation distortion; losses; mixed state; superconducting epitaxial layers; yttrium compounds; Al2O3; HTSC; Josephson vortices; YBaCuO; YBaCuO bicrystal grain boundaries; epitaxial films; intermodulation distortion; long Josephson junction; low-angle grain boundaries; microwave loss; microwave response; microwave-frequencies; misorientation angles; sapphire bicrystals; small DC magnetic fields; Distortion measurement; Electrical resistance measurement; Grain boundaries; Intermodulation distortion; Magnetic field measurement; Microwave measurements; Physics; Surface impedance; Transistors; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919646
  • Filename
    919646