Title :
Design and optimization of dual-threshold circuits for low-voltage low-power applications
Author :
Wei, Liqiong ; Chen, Zhanping ; Roy, Kaushik ; Johnson, Mark C. ; Ye, Yibin ; De, Vivek K.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fDate :
3/1/1999 12:00:00 AM
Abstract :
Reduction in leakage power has become an important concern in low-voltage, low-power, and high-performance applications. In this paper, we use the dual-threshold technique to reduce leakage power by assigning a high-threshold voltage to some transistors in noncritical paths, and using low-threshold transistors in critical path(s). In order to achieve the best leakage power saving under target performance constraints, an algorithm is presented for selecting and assigning an optimal high-threshold voltage. A general leakage current model which has been verified by HSPICE simulations is used to estimate leakage power. Results show that the dual-threshold technique is good for leakage power reduction during both standby and active modes. For some ISCAS benchmark circuits, the leakage power can be reduced by more than 80%. The total active power saving can be around 50% and 20% at low- and high-switching activities, respectively.
Keywords :
CMOS digital integrated circuits; SPICE; circuit simulation; delays; integrated circuit modelling; leakage currents; low-power electronics; HSPICE simulations; ISCAS benchmark circuits; active mode; critical path; dual-threshold circuits; high-switching activities; high-threshold voltage; leakage current model; leakage power; leakage power saving; low-switching activities; low-threshold transistors; low-voltage low-power applications; noncritical paths; standby mode; target performance constraints; total active power saving; CMOS technology; Circuit simulation; Delay estimation; Design optimization; Dynamic voltage scaling; Energy consumption; Leakage current; MOSFETs; Threshold voltage; Very large scale integration;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on