Title :
Spatially resolved measurements of critical parameters in superconducting filaments by laser scanning technique
Author :
Abraimov, D. ; Sivakov, A.G. ; Lukashenko, A.V. ; Fistul, M.V. ; Muller, P. ; Ustinov, A.V.
Author_Institution :
Phys. Inst., Erlangen-Nurnberg Univ., Germany
fDate :
3/1/2001 12:00:00 AM
Abstract :
We present an experimental study of local transport properties of superconducting filaments by means of low temperature scanning laser microscopy (LTSLM). A novel theoretical model that treats the laser-beam-induced voltage response is proposed and applied to analyze the measured data. The method of LTSLM allows to visualize the local inhomogeneities in individual filaments extracted from (Bi,Pb)2 Sr2Ca2Cu3O10+x/Ag tapes. Using the proposed theoretical analysis we extract the spatial distributions of the critical currents and critical temperatures over the sample. Tile data obtained by LTLSM show good agreement with standard non-local transport measurements. Using autocorrelation analysis of the voltage response, the characteristic length of the critical current variation is retrieved for filaments that belong to different parts of the tape
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; lead compounds; multifilamentary superconductors; silver; strontium compounds; superconducting tapes; superconducting transition temperature; (Bi,Pb)2Sr2Ca2Cu3O 10+x/Ag tapes; (BiPb)2Sr2Ca2Cu3O 10-Ag; autocorrelation analysis; characteristic length; critical current variation; critical parameters; high temperature superconductor; laser scanning technique; laser-beam-induced voltage response; local inhomogeneities; local transport properties; spatially resolved measurements; superconducting filaments; voltage response; Critical current; Data analysis; Data mining; Laser modes; Laser theory; Microscopy; Spatial resolution; Superconducting materials; Temperature; Voltage;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
