Title :
Local characterization of Y-Ba-Cu-O thin films
Author :
Shadrin, Pavel M. ; Korolev, Konstantin A. ; Hughes, Robert A. ; Nam, John K. ; Preston, John S.
Author_Institution :
Inst. of Radio Eng. & Electron., Acad. of Sci., Moscow, Russia
fDate :
3/1/2001 12:00:00 AM
Abstract :
A high-resolution spatially resolved study of electrical inhomogeneities in high-Tc thin films by Laser Scanning Microscopy has been carried out. A laser beam was focused onto a submicrometer spot on the surface of the thin film microbridge resulting in an increase in its local temperature. Bolometric or thermo-electric effects in the heated region result in a voltage change across the sample that has been measured as a function of the beam position. These two electrical images have been compared with optical images formed by subtracting two conventional images taken with polarized light. The correlation between the three images strongly suggest that interfaces between grains with different twin boundary orientations are more resistive than interfaces between grains with the same twin boundary orientation
Keywords :
barium compounds; high-temperature superconductors; light polarisation; optical microscopy; scanning probe microscopy; superconducting microbridges; superconducting thin films; thermoelectricity; twin boundaries; yttrium compounds; Y-Ba-Cu-O thin films; YBa2Cu3O7; bolometric effects; electrical images; electrical inhomogeneities; grains; high-Tc thin films; high-resolution spatially resolved study; interfaces; laser scanning microscopy; local characterization; local temperature; optical images; polarized light; submicrometer spot; thermo-electric effects; thin film microbridge; twin boundary orientations; voltage change; Focusing; Laser beams; Microscopy; Position measurement; Spatial resolution; Surface emitting lasers; Temperature; Transistors; Voltage; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
