DocumentCode :
1477842
Title :
Conductive buffer layers and overlayers for the thermal stability of coated conductors
Author :
Cantoni, C. ; Aytug, T. ; Verebelyi, D.T. ; Paranthaman, M. ; Specht, E.D. ; Norton, D.P. ; Christen, D.K.
Author_Institution :
Div. of Solid State, Oak Ridge Nat. Lab., TN, USA
Volume :
11
Issue :
1
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
3309
Lastpage :
3312
Abstract :
We analyze fundamental issues related to the thermal and electrical stability of a coated conductor during its operation. We address the role of conductive buffer layers in the stability of Ni-based coated conductors, and the effect of a metallic cap layer on the electrical properties of Ni alloy-based superconducting tapes. For the first case we report on the fabrication of a fully conductive RABiTS architecture formed of bilayers of conductive oxides SrRuO3 and LaNiO3 on textured Ni tapes. For the second case we discuss measurements of current-voltage relations on Ag/YBa2Cu3O7-δ and Cu/Ag/YBa2Cu3O7-δ prototype multilayers on insulating substrates. Limitations on the overall tape structure and properties that are posed by the stability requirement are presented
Keywords :
barium compounds; copper; high-temperature superconductors; lanthanum compounds; nickel alloys; silver; strontium compounds; superconducting superlattices; superconducting tapes; thermal stability; yttrium compounds; Ag/YBa2Cu3O7-δ; Cu-Ag-YBa2Cu3O7; Cu/Ag/YBa2Cu3O7-δ; LaNiO3; Ni alloy-based superconducting tapes; Ni-based coated conductors; SrRuO3; coated conductors; conductive buffer layers; current-voltage relations; electrical stability; fabrication; fully conductive RABiTS architecture; insulating substrates; metallic cap layer; multilayers; overlayers; textured Ni tapes; thermal stability; Buffer layers; Conductors; Current measurement; Fabrication; Nickel alloys; Prototypes; Stability analysis; Superconducting films; Thermal conductivity; Thermal stability;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.919770
Filename :
919770
Link To Document :
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