DocumentCode
1477865
Title
Development of nickel alloy substrates for Y-Ba-Cu-O coated conductor applications
Author
Nekkanti, Ram M. ; Seetharaman, Venkat ; Brunke, Lyle ; Maartense, I. ; Dempsey, Dave ; Kozlowski, Gregory ; Tomich, David ; Biggers, Rand ; Peterson, Timothy ; Barnes, P. ; Oberly, Charles E.
Author_Institution
UES Inc., Dayton, OH, USA
Volume
11
Issue
1
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
3321
Lastpage
3324
Abstract
Fabrication of long-length, textured substrates constitute a critical step in the successful application of coated High Temperature Superconductors (HTS). Substrate materials stronger than nickel are needed for robust applications, while substrates with non-magnetic characteristics are preferred for AC applications. The present work is thus focused on development of texture in high strength, non-magnetic substrate materials. As the development of cube texture is easier in medium to high stacking fault energy materials, binary alloys based on nickel were evaluated for the present application. High purity alloys were melted and hot/cold worked to obtain thin tapes. The development of texture in these alloys as a function of processing parameters was studied by X-ray diffraction and metallographic techniques. Orientation Imaging Microscopy (OIM) was used to quantify the extent of texture development in these substrates. Results to date on the development of texture by thermo-mechanical processing of these alloys are presented
Keywords
X-ray diffraction; barium compounds; cold working; high-temperature superconductors; hot working; melt texturing; metallography; nickel alloys; optical microscopy; stacking faults; substrates; superconducting tapes; thermomechanical treatment; yttrium compounds; AC applications; X-ray diffraction; Y-Ba-Cu-O coated conductor applications; YBa2Cu3O7; binary alloys; cube texture; high temperature superconductors; long-length textured substrates; metallographic techniques; nickel alloy substrates; nonmagnetic characteristics; orientation imaging microscopy; stacking fault energy; texture; thermo-mechanical processing; thin tapes; Fabrication; High temperature superconductors; Nickel alloys; Optical imaging; Robustness; Stacking; Superconducting materials; X-ray diffraction; X-ray imaging; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.919773
Filename
919773
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