Title :
Transverse-junction-stripe GaAs-AlGaAs lasers for squeezed light generation
Author :
Lathi, S. ; Tanaka, K. ; Morita, T. ; Inoue, S. ; Kan, H. ; Yamamoto, Y.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
fDate :
3/1/1999 12:00:00 AM
Abstract :
We fabricated 850-nm GaAs transverse-junction-stripe (TJS) lasers by an improved metal-organic chemical vapor deposition (MOCVD) and double Zn diffusion process. The high V/III ratio used during the MOCVD growth significantly reduced the intermixing of GaAs active layer and AlGaAs cladding layers. The modified process realized good confinement for both carriers and photons and smaller saturable loss. We measured squeezing of -2.8 dB (-4.5 dB after correction for detection efficiency) at a pumping rate of I/Ith≈20 from these lasers, which is in close agreement with the theoretical limit. This squeezing remained unchanged under injection locking, indicating almost perfect conservation of the intensity noise correlation among the longitudinal modes. These TJS lasers had very small low-frequency 1/f noise
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; laser mode locking; optical losses; optical saturation; optical squeezing; semiconductor lasers; 850 nm; AlGaAs cladding layers; GaAs; GaAs active layer; GaAs-AlGaAs; MOCVD; MOCVD growth; Zn; detection efficiency; double Zn diffusion process; high V/III ratio; injection locking; intensity noise correlation; longitudinal modes; metal-organic chemical vapor deposition; saturable loss; small low-frequency 1/f noise; squeezed light generation; transverse-junction-stripe GaAs-AlGaAs lasers; Chemical lasers; Chemical vapor deposition; Gallium arsenide; Laser mode locking; Laser noise; Laser theory; Low-frequency noise; MOCVD; Pump lasers; Zinc;
Journal_Title :
Quantum Electronics, IEEE Journal of