DocumentCode :
1477932
Title :
Low-noise gallium-arsenide charge-sensitive preamplifiers for low-temperature particle detectors
Author :
Alessandrello, A. ; Brofferio, C. ; Camin, D.V. ; Giuliani, A. ; Pessina, G. ; Previtali, E.
Author_Institution :
Dipartimento di Fisica, Milano Univ., Italy
Volume :
37
Issue :
3
fYear :
1990
fDate :
6/1/1990 12:00:00 AM
Firstpage :
1242
Lastpage :
1247
Abstract :
Charge-sensitive preamplifiers for operation between 1 K and 120 K have been developed and evaluated. They use double-gate GaAs MESFETs selected for their low 1/f noise. These devices are operated with both gates interconnected, emulating single-gate MESFETs of double gate-length, obtaining in this way a value of Af, (the coefficient of the 1/f noise spectral power density), of 1.7×10-13 V2 at 77 K and 3.8×10-14 V2 at 4 K. The latter is one-fourth of the value exhibited by the original device before modification and two orders of magnitude less than the value measured at 300 K. At the optimum bias, operating point device transconductance is 6 mA/V and the power dissipation 360 μW. The input capacitance is less than 5 pF, therefore Hf, the 1/f noise characteristic parameter, is lower than 8.5×10-25 J and 1.9×10-25 J at 77 K and 4 K respectively. The basic circuit configuration consists of a double-cascade loaded with a bootstrapped current source. In this way, a high gain-bandwidth product is obtained despite the low dynamic output resistance, 3000 Ω, exhibited by the MESFETs at the operating point
Keywords :
Schottky gate field effect transistors; gallium arsenide; nuclear electronics; preamplifiers; 1 to 120 K; 1.9×10-25 J; 1/f noise; 1/f noise characteristic parameter; 1/f noise spectral power density; 3000 ohm; 360 muW; 4 K; 5 pF; 77 K; GaAs charge sensitive preamplifiers; bootstrapped current source; double-cascade; dynamic output resistance; input capacitance; low noise; operating point device transconductance; optimum bias; power dissipation; single-gate MESFETs; Capacitance; Density measurement; Gallium arsenide; Integrated circuit interconnections; MESFETs; Noise measurement; Power dissipation; Power measurement; Preamplifiers; Transconductance;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.57373
Filename :
57373
Link To Document :
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