• DocumentCode
    1477997
  • Title

    Williams-Comstock model with finite-length transition functions

  • Author

    Valstyn, Erich P. ; Bond, Charles R.

  • Author_Institution
    Read-Rite Corp., Milpitas, CA, USA
  • Volume
    35
  • Issue
    2
  • fYear
    1999
  • fDate
    3/1/1999 12:00:00 AM
  • Firstpage
    1070
  • Lastpage
    1076
  • Abstract
    The theory of the third-order-polynomial (TOP) and fifth-order-polynomial (FOP) magnetization transitions is presented. These transitions have a finite length, rather than an asymptotic approach to ±Mr., which is the case with some widely-used transition functions. The Williams-Comstock model is used to obtain the transition parameters, which are equal to half the transition lengths, resulting in quadratic equations and simple expressions. In this analysis, the write-field gradient is maximized with respect to the deep-gap field, as well as with respect to the distance of the transition from gap center, which results in a higher gradient than is obtained with the original Williams-Comstock approach, at the expense of a higher write current. Analytic expressions are obtained for the read pulses of inductive and shielded magnetoresistive heads, and equations for nonlinear transition shift are derived for the arctangent and the TOP transitions. The results are compared with those obtained using arctangent and tanh transitions and with experiment. In addition, certain aspects of the write-process Q function and the optimum deep-gap field are discussed
  • Keywords
    magnetic heads; magnetic shielding; magnetisation; magnetoresistive devices; TOP transition; Williams-Comstock model; arctangent transition; deep-gap field; fifth-order-polynomial; finite-length transition functions; inductive heads; longitudinal recording; magnetization transitions; magnetoresistive heads; quadratic equations; shielded heads; third-order-polynomial; write-field gradient; write-process Q function; Bonding; Demagnetization; Helium; Magnetic analysis; Magnetic heads; Magnetic recording; Magnetization; Magnetoresistance; Nonlinear equations; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.748855
  • Filename
    748855