• DocumentCode
    1477998
  • Title

    Experimental Investigation of Thermally Induced Nonlinearities in Aluminum Nitride Contour-Mode MEMS Resonators

  • Author

    Tazzoli, Augusto ; Rinaldi, Matteo ; Piazza, Gianluca

  • Author_Institution
    Dept. of Electr. & Syst. Eng., Univ. of Pennsylvania, Philadelphia, PA, USA
  • Volume
    33
  • Issue
    5
  • fYear
    2012
  • fDate
    5/1/2012 12:00:00 AM
  • Firstpage
    724
  • Lastpage
    726
  • Abstract
    The aim of this letter is to experimentally demonstrate that the source of amplitude-frequency (A-f) nonlinearities in aluminum nitride contour-mode MEMS resonators is to be attributed to the softening of the equivalent device Young´s modulus due to self-heating effects. Resonators with a center frequency of about 1.16 GHz are here investigated as a case study. The resonator self-heating was evaluated by integrating a platinum serpentine in the resonator body and using it as an efficient temperature sensor. The observations of this work are supported by the comparison of the shift of the A-f plots measured at different ambient temperatures with the direct recording of the resonator-temperature increase during VNA frequency sweeps.
  • Keywords
    III-V semiconductors; Young´s modulus; aluminium compounds; micromechanical resonators; temperature sensors; wide band gap semiconductors; AlN; Young´s modulus; aluminum nitride contour-mode MEMS resonators; amplitude-frequency nonlinearities; frequency 1.16 GHz; platinum serpentine; self-heating effects; temperature sensor; thermally induced nonlinearities; Aluminum nitride; Frequency measurement; Micromechanical devices; Radio frequency; Resonant frequency; Temperature measurement; Temperature sensors; Aluminum nitride contour-mode resonator; MEMS; nonlinearity; self-heating;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2188491
  • Filename
    6174439