Ion beam assisted growth of fluorite type oxide template films for biaxially textured HTSC coated conductors

Biaxially aligned growth was studied by a dual-ion-beam sputtering method for fluorite type (Zr_0.85Y_0.15O_1.93 (YSZ), Hf_0.74Yb_0.26O_1.87, CeO ₂), pyrochlore type (Zr₂Sm₂O₇), and rare earth C type (Y ₂O₃, Sm₂O₃) oxide films on polycrystalline Ni-based alloy substrates. Cube-textured (all axes aligned with a ⟨100⟩ axis substrate normal) films were obtained by low energy (<300 eV) ion bombardment at low temperatures (<300°C). The assisting ion energy dependence of crystalline alignment was discussed in connection with lattice energies for these oxide crystals. Furthermore, a fluorite-like type oxide (Zr-X-O) was found to have a shorter time constant of texture evolution than YSZ. I _c=98A (J_c=0.65 MA/cm²) was obtained for a 1.5 μm thick Y-123 film on Zr-X-O