Transmission electron microscopy investigation of texture development in magnesium oxide buffer layers

Author

Koritala, Rachel E. ; Chudzik, Michael P. ; Luo, Zhiping ; Miller, Dean J. ; Kannewurf, Carl R. ; Balachandran, Uthamalingam

Author_Institution

Div. of Energy Technol., Argonne Nat. Lab., IL, USA

Volume

11

Issue

1

fYear

2001

fDate

3/1/2001 12:00:00 AM

Firstpage

3473

Lastpage

3476

Abstract

Biaxially textured magnesium oxide (MgO) buffer layers were grown by inclined substrate deposition and examined before YBa₂Cu ₃O_7-x deposition to optimize their texture. Transmission electron microscopy of buffer layers in both cross-sectional and plan view was used to investigate film microstructure and texture development as a function of deposition thickness (0.05-3 μm) and substrate inclination angle (0-55° from the substrate normal). It was determined that the combined effects of preferential growth of the {200} equilibrium crystal habit of MgO and shadowing by columnar grains led to the development of off-axis (200)-textured films

Keywords

barium compounds; crystal microstructure; electron beam deposition; high-temperature superconductors; magnesium compounds; substrates; surface texture; transmission electron microscopy; yttrium compounds; 0.05 to 3 mum; MgO; MgO buffer layers; YBa₂Cu₃O_7-x deposition; YBa₂Cu₃O₇; biaxially textured magnesium oxide; columnar grains; cross-sectional TEM; deposition thickness; film microstructure; inclined substrate deposition; magnesium oxide buffer layers; off-axis (200)-textured films; plan view; preferential growth; substrate inclination angle; texture development; transmission electron microscopy; {200} equilibrium crystal habit; Buffer layers; Critical current density; Laboratories; Magnesium oxide; Microstructure; Substrates; Superconducting films; Transmission electron microscopy; US Department of Energy; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.919811

Filename

919811