DocumentCode
1478210
Title
Linearizing the read process for write nonlinearity measurements
Author
Wilson, Bruce A. ; Wang, Shan X. ; Taratorin, Alex M.
Author_Institution
Dept. of Electr. Eng., Stanford Univ., CA, USA
Volume
33
Issue
5
fYear
1997
fDate
9/1/1997 12:00:00 AM
Firstpage
2692
Lastpage
2694
Abstract
Many standard tests for write nonlinearities such as nonlinear transition shift and partial erasure assume a linear read process. Nonlinear effects from readback with a magnetoresistive head can make the results of these tests difficult to interpret. We show how a polynomial can be used to approximate the inverse transfer function and thus linearize the read channel. Write nonlinearities can be measured more easily by performing tests on the linearized channel. We also show how linearizing the channel for PRML detection is limited by amplification of noise over parts of the inverse transfer curve with high differential gain
Keywords
linearisation techniques; magnetic heads; magnetoresistive devices; polynomials; transfer functions; PRML detection; channel linearization; differential gain; inverse transfer function; magnetoresistive read head; noise amplification; nonlinear transition shift; partial erasure; polynomial; readback; write nonlinearity measurement; Analog-digital conversion; Autocorrelation; Density measurement; Energy measurement; Frequency estimation; Loss measurement; Magnetic heads; Magnetoresistance; Pattern analysis; Performance evaluation; Polynomials; Testing; Transfer functions; Velocity measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.617447
Filename
617447
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