DocumentCode
1478227
Title
Monitoring Software Quality Evolution for Defects
Author
Zhang, Hongyu ; Kim, Sunghun
Author_Institution
Tsinghua Univ., Beijing, China
Volume
27
Issue
4
fYear
2010
Firstpage
58
Lastpage
64
Abstract
Quality control charts, especially c-charts, can help monitor software quality evolution for defects over time. c-charts of the Eclipse and Gnome systems showed that for systems experiencing active maintenance and updates, quality evolution is complicated and dynamic. The authors identify six quality evolution patterns and describe their implications. Quality assurance teams can use c-charts and patterns to monitor quality evolution and prioritize their efforts.
Keywords
quality assurance; software quality; Eclipse; Gnome system; c-charts; quality assurance teams; quality control charts; quality evolution patterns; software quality evolution monitoring; maintenance management; quality evolution; software engineering; software quality; software quality assurance; statistical process control;
fLanguage
English
Journal_Title
Software, IEEE
Publisher
ieee
ISSN
0740-7459
Type
jour
DOI
10.1109/MS.2010.66
Filename
5453334
Link To Document