Title :
Monitoring Software Quality Evolution for Defects
Author :
Zhang, Hongyu ; Kim, Sunghun
Author_Institution :
Tsinghua Univ., Beijing, China
Abstract :
Quality control charts, especially c-charts, can help monitor software quality evolution for defects over time. c-charts of the Eclipse and Gnome systems showed that for systems experiencing active maintenance and updates, quality evolution is complicated and dynamic. The authors identify six quality evolution patterns and describe their implications. Quality assurance teams can use c-charts and patterns to monitor quality evolution and prioritize their efforts.
Keywords :
quality assurance; software quality; Eclipse; Gnome system; c-charts; quality assurance teams; quality control charts; quality evolution patterns; software quality evolution monitoring; maintenance management; quality evolution; software engineering; software quality; software quality assurance; statistical process control;
Journal_Title :
Software, IEEE
