• DocumentCode
    1478227
  • Title

    Monitoring Software Quality Evolution for Defects

  • Author

    Zhang, Hongyu ; Kim, Sunghun

  • Author_Institution
    Tsinghua Univ., Beijing, China
  • Volume
    27
  • Issue
    4
  • fYear
    2010
  • Firstpage
    58
  • Lastpage
    64
  • Abstract
    Quality control charts, especially c-charts, can help monitor software quality evolution for defects over time. c-charts of the Eclipse and Gnome systems showed that for systems experiencing active maintenance and updates, quality evolution is complicated and dynamic. The authors identify six quality evolution patterns and describe their implications. Quality assurance teams can use c-charts and patterns to monitor quality evolution and prioritize their efforts.
  • Keywords
    quality assurance; software quality; Eclipse; Gnome system; c-charts; quality assurance teams; quality control charts; quality evolution patterns; software quality evolution monitoring; maintenance management; quality evolution; software engineering; software quality; software quality assurance; statistical process control;
  • fLanguage
    English
  • Journal_Title
    Software, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7459
  • Type

    jour

  • DOI
    10.1109/MS.2010.66
  • Filename
    5453334