DocumentCode
1478426
Title
Evaluation methods for the examination of thick film materials
Author
Coleman, M.V.
Volume
45
Issue
3
fYear
1975
fDate
3/1/1975 12:00:00 AM
Firstpage
121
Lastpage
130
Abstract
This paper describes analytical and evaluation techniques developed to provide a comprehensive picture of thick film materials. Examples are presented of the usefulness of the techniques in examining thick film materials and establishing the interactions which occur during processing. In particular, it is shown how the microstructure of the Du Pont 7800 and 1100 resistor systems have been identified, and how these structures are of use in understanding the electrical properties of fired resistors.
Keywords
chemical analysis; materials testing; thick films; X-ray diffraction analysis; atomic absorption spectroscopy; chemical analysis; evaluation methods; examination; thick film materials;
fLanguage
English
Journal_Title
Radio and Electronic Engineer
Publisher
iet
ISSN
0033-7722
Type
jour
DOI
10.1049/ree.1975.0022
Filename
5268427
Link To Document