DocumentCode
1478664
Title
An investigation of integrated circuit destruction by noise pulses
Author
Appleby, T.H.
Author_Institution
, Saint Germain-en-Laye, France
Volume
43
Issue
4
fYear
1973
fDate
4/1/1973 12:00:00 AM
Firstpage
279
Lastpage
287
Abstract
Conventional integrated circuits have a high failure rate when operated in an environment including electromechanical switching systems. This paper discusses the destruction modes for the circuits and the equivalent circuit for the noise generation system. Experimental results which support the concept of the equivalent circuit are discussed. Finally, the transient thermal characteristics of typical packaging systems are briefly discussed.
Keywords
integrated circuits; noise; destruction modes; electromechanical switching systems; equivalent circuit; integrated circuit destruction by noise pulses; noise generation system; packaging systems; transient thermal characteristics;
fLanguage
English
Journal_Title
Radio and Electronic Engineer
Publisher
iet
ISSN
0033-7722
Type
jour
DOI
10.1049/ree.1973.0043
Filename
5268468
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