• DocumentCode
    1478733
  • Title

    Free-p: A Practical End-to-End Nonvolatile Memory Protection Mechanism

  • Author

    Yoon, Doe Hyun ; Muralimanohar, Naveen ; Chang, Jichuan ; Ranganathan, Parthasarathy ; Jouppi, Norman P. ; Erez, Mattan

  • Volume
    32
  • Issue
    3
  • fYear
    2012
  • Firstpage
    79
  • Lastpage
    87
  • Abstract
    Free-p-fine-grained remapping with error checking and correcting (ECC) and embedded pointers-remaps worn-out nonvolatile RAM (NVRAM) blocks at a fine granularity without requiring large dedicated storage and protects NVRAM against both hard and soft errors. Furthermore, Free-p can be implemented purely in the memory controller, avoiding custom NVRAM devices.
  • Keywords
    random-access storage; ECC; NVRAM; dedicated storage; error checking and correcting; free-p; hard errors; memory controller; nonvolatile RAM; practical end-to-end nonvolatile memory protection mechanism; soft errors; Error correction codes; Memory management; Nonvolatile memory; Phase change random access memory; Random access memory; Reliability; Resistance; error correction codes; memory; nonvolatile memory; phase-change random access memory; reliability; resistance;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2012.15
  • Filename
    6174996
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1478733