• DocumentCode
    1478896
  • Title

    The variation of Jcgb with GB misorientation and inclination measured using the scanning SQUID microscope

  • Author

    Tsai, Jack W.H. ; Chan, Siu-Wai ; Kirtley, John R. ; Tidrow, S.C. ; Jiang, Q.

  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    3880
  • Lastpage
    3883
  • Abstract
    The scanning SQUID microscope was used to measure the Josephson penetration length (λJ) along the grain boundary. The Jc across the grain boundary was then derived from the λJ. YBa2Cu3O7-x (YBCO) films were deposited on a special set of SrTiO3 bicrystals to determine whether Jcgb varies as function of boundary inclinations (α´s). Our results showed that Jcgb decreased with α while α2 remained constant and vice-versa. The Jcgb decreased exponentially with misorientation (θ). In addition, SEM studies showed that the boundaries meandered on the length scan of 0.5-2 μm due to the island growth mode. The drop of Jcgb with increasing α1 and/or α2 is more than what can be explained by either the d-wave symmetry of its superconducting order parameters or boundary meandering
  • Keywords
    Josephson effect; barium compounds; critical current density (superconductivity); grain boundaries; high-temperature superconductors; penetration depth (superconductivity); scanning electron microscopy; superconducting thin films; yttrium compounds; Josephson penetration length; SEM; SrTiO3; SrTiO3 bicrystal substrate; YBa2Cu3O7-x; YBa2Cu3O7; boundary inclinations; boundary meandering; d-wave symmetry; films; grain boundary; grain boundary critical current density; island growth mode; scanning SQUID microscope; superconducting order parameters; Critical current density; Grain boundaries; High temperature superconductors; Length measurement; Lifting equipment; Materials science and technology; Q measurement; SQUIDs; Scanning electron microscopy; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919914
  • Filename
    919914