• DocumentCode
    147899
  • Title

    Test Suite Prioritization by Switching Cost

  • Author

    Huayao Wu ; Changhai Nie ; Fei-Ching Kuo

  • Author_Institution
    State Key Lab. for Novel Software Technol., Nanjing Univ., Nanjing, China
  • fYear
    2014
  • fDate
    March 31 2014-April 4 2014
  • Firstpage
    133
  • Lastpage
    142
  • Abstract
    Test suite generation and prioritization are two main research fields to improve testing efficiency. Combinatorial testing has been proven as an effective method to generate test suite for highly configurable software systems, while test suites are often prioritized by interaction coverage to detect faults as early as possible. However, for some cases, there exists reasonable cost of reconfiguring parameter settings when switching test cases in different orders. Surprisingly, only few studies paid attention to it. In this paper, by proposing greedy algorithms and graph-based algorithms, we aim to prioritize a given test suite to minimize its total switching cost. We also compare two different prioritization strategies by a series of experiments, and discuss the advantages of our prioritization strategy and the selection of prioritization techniques. The results show that prioritization by switching cost can improve testing efficiency and our prioritization strategy can produce a small test suite with a reasonably low switching cost. This prioritization can be used widely and help locate fault causing interactions. The results also suggest that when testing highly configurable software systems and no knowledge of fault detection can be used, prioritization by switching cost is a good choice to detect faults earlier.
  • Keywords
    fault location; graph theory; greedy algorithms; minimisation; program testing; software cost estimation; software fault tolerance; combinatorial testing; configurable software systems; fault detection; fault location; graph-based algorithms; greedy algorithms; interaction coverage; reconfiguring parameter settings; switching cost minimisation; test suite generation; test suite prioritization strategy; testing efficiency improvement; Arrays; Fault detection; Greedy algorithms; Heuristic algorithms; Software; Switches; Testing; Combinatorial Testing; Switching Cost; Test Suite Prioritization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Testing, Verification and Validation Workshops (ICSTW), 2014 IEEE Seventh International Conference on
  • Conference_Location
    Cleveland, OH
  • Type

    conf

  • DOI
    10.1109/ICSTW.2014.15
  • Filename
    6825648