• DocumentCode
    1479071
  • Title

    A study of oscillator jitter due to supply and substrate noise

  • Author

    Herzel, Frank ; Razavi, Behzad

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    46
  • Issue
    1
  • fYear
    1999
  • fDate
    1/1/1999 12:00:00 AM
  • Firstpage
    56
  • Lastpage
    62
  • Abstract
    This paper investigates the timing jitter of single-ended and differential CMOS ring oscillators due to supply and substrate noise. We calculate the jitter resulting from supply and substrate noise, show that the concept of frequency modulation can be applied, and derive relationships that express different types of jitter in terms of the sensitivity of the oscillation frequency to the supply or substrate voltage. Using examples based on measured results, we show that thermal jitter is typically negligible compared to supply- and substrate-induced jitter in high-speed digital systems. We also discuss the dependence of the jitter of differential CMOS ring oscillators on transistor gate width, power consumption, and the number of stages
  • Keywords
    CMOS digital integrated circuits; digital phase locked loops; frequency modulation; high-speed integrated circuits; integrated circuit noise; oscillators; phase noise; timing jitter; PLL; differential CMOS ring oscillators; frequency modulation; high-speed digital systems; oscillation frequency sensitivity; oscillator jitter; power consumption; single-ended CMOS ring oscillators; substrate noise; supply noise; thermal jitter; timing jitter; transistor gate width; Circuit noise; Clocks; Digital circuits; Jitter; Phase locked loops; Phase noise; Ring oscillators; Semiconductor device noise; Substrates; Voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.749085
  • Filename
    749085