DocumentCode :
1479071
Title :
A study of oscillator jitter due to supply and substrate noise
Author :
Herzel, Frank ; Razavi, Behzad
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Volume :
46
Issue :
1
fYear :
1999
fDate :
1/1/1999 12:00:00 AM
Firstpage :
56
Lastpage :
62
Abstract :
This paper investigates the timing jitter of single-ended and differential CMOS ring oscillators due to supply and substrate noise. We calculate the jitter resulting from supply and substrate noise, show that the concept of frequency modulation can be applied, and derive relationships that express different types of jitter in terms of the sensitivity of the oscillation frequency to the supply or substrate voltage. Using examples based on measured results, we show that thermal jitter is typically negligible compared to supply- and substrate-induced jitter in high-speed digital systems. We also discuss the dependence of the jitter of differential CMOS ring oscillators on transistor gate width, power consumption, and the number of stages
Keywords :
CMOS digital integrated circuits; digital phase locked loops; frequency modulation; high-speed integrated circuits; integrated circuit noise; oscillators; phase noise; timing jitter; PLL; differential CMOS ring oscillators; frequency modulation; high-speed digital systems; oscillation frequency sensitivity; oscillator jitter; power consumption; single-ended CMOS ring oscillators; substrate noise; supply noise; thermal jitter; timing jitter; transistor gate width; Circuit noise; Clocks; Digital circuits; Jitter; Phase locked loops; Phase noise; Ring oscillators; Semiconductor device noise; Substrates; Voltage-controlled oscillators;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7130
Type :
jour
DOI :
10.1109/82.749085
Filename :
749085
Link To Document :
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