Title :
Differential Extrapolation Method for Separating Dielectric and Rough Conductor Losses in Printed Circuit Boards
Author :
Koul, Amendra ; Koledintseva, Marina Y. ; Hinaga, Scott ; Drewniak, James L.
Author_Institution :
Cisco Syst., Inc., San Jose, CA, USA
fDate :
4/1/2012 12:00:00 AM
Abstract :
Copper foil in printed circuit board (PCB) transmission lines/interconnects is roughened to promote adhesion to dielectric substrates. It is important to characterize PCB substrate dielectrics and correctly separate dielectric and conductor losses, especially as data rates in high-speed digital designs increase. Herein, a differential method is proposed for separating conductor and dielectric losses in PCBs with rough conductors. This approach requires at least three transmission lines with identical, or at least as close as technologically possible, basic geometry parameters of signal trace, distance-to-ground planes, and dielectric properties, while the average peak-to-valley amplitude of surface roughness of the conductor would be different. The peak-to-valley amplitude of conductor roughness is determined from scanning electron microscopy images.
Keywords :
adhesion; conductors (electric); dielectric losses; extrapolation; permittivity; printed circuit interconnections; printed circuits; scanning electron microscopy; surface roughness; PCB substrate dielectrics; average peak-to-valley amplitude; conductor roughness; dielectric loss; differential extrapolation method; distance-to-ground planes; high-speed digital designs; printed circuit board transmission lines; printed circuit boards interconnects; rough conductor loss; scanning electron microscopy images; signal trace geometry parameters; surface roughness; three transmission lines; Conductors; Dielectric losses; Rough surfaces; Surface impedance; Surface roughness; Transmission line measurements; $hbox{S}$-parameters; Conductor surface roughness; dielectric constant (Dk); dissipation factor (Df); loss tangent; printed circuit board (PCB);
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2010.2087341