Title :
A High-Resolution Time-to-Digital Converter on FPGA Using Dynamic Reconfiguration
Author :
Daigneault, Marc-Andre ; David, Jean Pierre
Author_Institution :
Dept. of Electr. Eng., Ecole Polytech. de Montreal, Montreal, QC, Canada
fDate :
6/1/2011 12:00:00 AM
Abstract :
A high-resolution high-precision time-to-digital converter (TDC) architecture is presented for implementation on field-programmable gate arrays (FPGAs) supporting dynamic reconfiguration. The proposed architecture relies on multiple parallel high-resolution delay lines implemented by the programmable interconnection points within the routing switch fabric. These delay lines feature a 1-ps resolution over a range of 3 ns. A calibration process is proposed to take process-voltage-temperature variations, as well as clock skew, into account. A TDC with a 50-ps resolution and precision as high as 35 ps has been implemented on a Virtex-II Pro FPGA. Results show that the proposed architecture and calibration process can be used to achieve resolutions as fine as 10 ps.
Keywords :
calibration; convertors; delay lines; field programmable gate arrays; TDC architecture; Virtex-II pro FPGA; calibration process; delay lines; dynamic reconfiguration; field-programmable gate array; high-resolution time-to-digital converter; multiple parallel high-resolution delay line; process-voltage-temperature variation; programmable interconnection point; routing switch fabric; time 1 ps; time 10 ps; time 3 ns; time 35 ps; time 50 ps; Calibration; Clocks; Delay; Delay lines; Field programmable gate arrays; Oscillators; Table lookup; Dynamic reconfiguration; field-programmable gate array (FPGA); time-interval measurement; time-to-digital converter (TDC);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2011.2115390