DocumentCode :
1479536
Title :
Thermal-demand-meter testing techniques
Volume :
65
Issue :
6
fYear :
1946
fDate :
6/1/1946 12:00:00 AM
Firstpage :
514
Lastpage :
515
Abstract :
Discussion of paper 46–69 by E. E. Lynch and M. E. Douglass, presented at the AIEE winter convention, New York, N. York, January 21–25, 1946, and published in AIEE TRANSACTIONS, 1946, March section, pages 124–8.
Keywords :
Circuit faults; Companies; Instruments; Rectifiers; Resistance; Standards; Transient analysis;
fLanguage :
English
Journal_Title :
Electrical Engineering
Publisher :
ieee
ISSN :
0095-9197
Type :
jour
DOI :
10.1109/EE.1946.6441774
Filename :
6441774
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1479536
