DocumentCode
1479608
Title
Highly Linear RF CMOS Variable Attenuators With Adaptive Body Biasing
Author
Huang, Yan-Yu ; Woo, Wangmyong ; Yoon, Youngchang ; Lee, Chang-Ho
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
Volume
46
Issue
5
fYear
2011
fDate
5/1/2011 12:00:00 AM
Firstpage
1023
Lastpage
1033
Abstract
Several approaches to design a linear attenuator have been analyzed in terms of the transistor impedance variation, linearity, frequency responses, and circuit complexity. This paper proposes a novel method of using an adaptive bootstrapped body biasing. The method allows the attenuator to have maximum power handling capability and bandwidth without adding complexity to the circuit. A π-type variable attenuator for WCDMA transmitters has been designed and fabricated using IBM 0.18-μ m triple-well CMOS technology. The attenuator has a linear-in-dB controllability from 400 MHz to 3.7 GHz with an attenuation range of 33 dB. Its insertion loss is 0.9-2.9 dB and worst-case return loss is better than -9 dB within this frequency band. The minimum input 1-dB compression point (IP1dB) is above 7.5 dBm, and the minimum IIP3 is greater than 17 dBm at 1.95 GHz. To our knowledge, this design achieves the best linearity performance and frequency responses, and has the smallest area among similar CMOS works.
Keywords
attenuators; circuit complexity; controllability; CMOS technology; WCDMA transmitter; adaptive bootstrapped body biasing; bandwidth; circuit complexity; controllability; frequency 400 MHz to 3.7 GHz; frequency band; frequency response; insertion loss; linear RF CMOS variable attenuator; power handling capability; size 0.18 mum; transistor impedance variation; worst-case return loss; Attenuation; Attenuators; CMOS integrated circuits; Immune system; Impedance; Linearity; Transistors; Attenuators; CMOS attenuators; body effect; bootstrapped body bias; highly linear attenuators; parasitic effects; variable attenuators;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2011.2117530
Filename
5738357
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