DocumentCode :
1479658
Title :
Minimum-Distance Parametric Estimation Under Progressive Type-I Censoring
Author :
Balakrishnan, Narayanaswamy ; Bordes, Laurent ; Zhao, Xuejing
Author_Institution :
Dept. of Math. & Stat., McMaster Univ., Hamilton, ON, Canada
Volume :
59
Issue :
2
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
413
Lastpage :
425
Abstract :
The objective of this paper is to provide a new estimation method for parametric models under progressive Type-I censoring. First, we propose a Kaplan-Meier nonparametric estimator of the reliability function taken at the censoring times. It is based on the observable number of failures, and the number of censored units occurring from the progressive censoring scheme at the censoring times. This estimator is then shown to asymptotically follow a normal distribution. Next, we propose a minimum-distance method to estimate the unknown Euclidean parameter of a given parametric model. This method leads to consistent, asymptotically normal estimators. The maximum likelihood estimation method based on group-censored samples is discussed next, and the efficiencies of these two methods are compared numerically. Then, based on the established results, we derive a method to obtain the optimal Type-I progressive censoring scheme, Finally we illustrate all these results through a Monte Carlo simulation study, and an illustrative example.
Keywords :
Monte Carlo methods; estimation theory; failure analysis; parameter estimation; reliability; Euclidean parameter; Kaplan-Meier nonparametric estimator; Monte Carlo simulation; asymptotic distribution; censored units; failures; group-censored samples; minimum-distance parametric estimation; progressive type-I censoring; reliability function; Asymptotic distribution; Kaplan-Meier estimator; Nelson-Aalen estimator; martingale; maximum likelihood estimator; minimum variance linear estimator; minimum-distance estimator; optimal progressive censoring scheme; progressive Type-I censoring scheme;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2010.2044615
Filename :
5454398
Link To Document :
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