Title :
Ion beam deposition and structural characterization of GMR spin valves
Author :
Wang, S.X. ; Bailey, W.E. ; Sürgers, C.
Author_Institution :
Dept. of Mater. Sci. & Eng., Stanford Univ., CA, USA
fDate :
5/1/1997 12:00:00 AM
Abstract :
NiO exchange-biased “bottom” spin valves of the type NiO/NiFe/Co/Cu/Co/NiFe and FeMn exchange-biased “top” spin valves of the type NiFe/Co/Cu/Co/NiFe/FeMn were deposited by ion-beam deposition (except the NiO layer). Their magnetic properties, magneto-transport, and microstructures are characterized and compared with corresponding GMR spin valves deposited by dc magnetron sputtering. High-resolution cross-sectional transmission electron microscopy and X-ray diffraction reveal microstructural differences between ion-beam-deposited and dc magnetron sputtered spin valves. In particular, film texture, surface morphology, GMR ratio, exchange bias, interlayer coupling strength, and coercivity vary widely, but property-structure-processing correlation can be identified. A GMR ratio of ~9.7% was obtained on random textured NiO exchange-biased bottom spin valves by ion-beam deposition
Keywords :
X-ray diffraction; coercive force; crystal microstructure; exchange interactions (electron); giant magnetoresistance; ion beam applications; iron alloys; magnetic heads; magnetic multilayers; magnetoresistive devices; manganese alloys; nickel compounds; surface structure; texture; transmission electron microscopy; vacuum deposition; FeMn exchange-biased top spin valves; GMR ratio; GMR spin valves; NiFe-Co-Cu-Co-NiFe-FeMn; NiFe/Co/Cu/Co/NiFe/FeMn; NiO exchange-biased bottom spin valves; NiO-NiFe-Co-Cu-Co-NiFe; NiO/NiFe/Co/Cu/Co/NiFe; X-ray diffraction; coercivity; exchange bias; film texture; high-resolution cross-sectional transmission electron microscopy; interlayer coupling strength; ion beam deposition; magnetic properties; magnetic recording heads; magneto-transport; microstructures; property-structure-processing correlation; structural characterization; surface morphology; Ion beams; Magnetic films; Magnetic force microscopy; Magnetic properties; Microstructure; Spin valves; Sputtering; Surface morphology; Transmission electron microscopy; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
